Parameter extraction and 1/f noise in a surface and a bulk-type, p-channel LDD MOSFET
- 30 November 1994
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 37 (11), 1853-1862
- https://doi.org/10.1016/0038-1101(94)90177-5
Abstract
No abstract availableKeywords
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