A scanning electron microscopy specimen holder for viewing different angles of a single specimen
- 1 March 2010
- journal article
- research article
- Published by Wiley in Microscopy Research and Technique
- Vol. 73 (12), 1073-1076
- https://doi.org/10.1002/jemt.20835
Abstract
The specimen holder for scanning electron microscopy described herein allows a single specimen to be examined in any possible view and significantly improves object illumination. The specimen is glued to a fine pin and flexibly mounted on a double-sided adhesive conductive pad on a rotatable pivot. A milled pot placed beneath the specimen acts as an electron trap. This provides a homogeneous black image background by minimizing noisy signals from the specimen's surroundings. Microsc. Res. Tech. 73:1073–1076, 2010.Keywords
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