Direct observation of isolated ultrananodimensional diamond clusters using atomic force microscopy

Abstract
Isolated ultrananodimensional diamond (UND) particles obtained by means of detonation synthesis have been studied using atomic force microscopy (AFM). The UND particles were deposited onto the surface of highly oriented pyrolytic graphite from a suspension based on organic compounds. The deposited UND particles were deaggregated using a two-stage treatment with ultrasound and high-dynamic-pressure pulses. The isolated UND particles were stabilized in suspension by a benzene additive. AFM images of individual UND particles have been obtained, and the phenomenon of their alignment along atomic steps on the substrate surface has been observed.