A Global Quality Measurement of Pan-Sharpened Multispectral Imagery
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- 25 October 2004
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Geoscience and Remote Sensing Letters
- Vol. 1 (4), 313-317
- https://doi.org/10.1109/lgrs.2004.836784
Abstract
This letter focuses on quality assessment of fusion of multispectral (MS) images with high-resolution panchromatic (Pan) observations. A new quality index suitable for MS imagery having four spectral bands is defined from the theory of hypercomplex numbers, or quaternions. Both spectral and radiometric distortion measurements are encapsulated in a unique measurement, simultaneously accounting for local mean bias, changes in contrast, and loss of correlation of individual bands, together with spectral distortion. Results are presented and discussed on very high-resolution QuickBird data, through comparisons between state-of-the-art and advanced MS+Pan merge algorithms.Keywords
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