Sub-Ångstrom high-resolution transmission electron microscopy at 300keV
- 27 November 2001
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 89 (4), 215-241
- https://doi.org/10.1016/s0304-3991(01)00094-8
Abstract
No abstract availableKeywords
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