Ge nanocrystals embedded in SiO2 in MOS based radiation sensors
Open Access
- 1 November 2010
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 268 (22), 3417-3420
- https://doi.org/10.1016/j.nimb.2010.09.007
Abstract
No abstract availableKeywords
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