Single nanoparticle measurement techniques
- 1 May 2000
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 87 (9), 5094-5096
- https://doi.org/10.1063/1.373259
Abstract
Various single particle measuring techniques are briefly reviewed and the basic concepts of a new micro-SQUID technique are discussed. It allows measurements of the magnetization reversal of single nanometer-sized particles at low temperature. The influence of the measuring technique on the system of interest is discussed.Keywords
This publication has 29 references indexed in Scilit:
- Pulse Self-Compression in the Subcarrier Cycle RegimePhysical Review Letters, 1999
- Anisotropic magnetoresistance as a probe of magnetization reversal in individual nono-sized nickel wiresIEEE Transactions on Magnetics, 1998
- Magnetoresistance Governed by Fluctuations in Ultrasmall Ni/NiO/Co JunctionsPhysical Review Letters, 1997
- Effect of microwaves on domain wall motion in thin Ni wiresEurophysics Letters, 1996
- Measurement of the Dynamics of the Magnetization Reversal in Individual Single-Domain Ferromagnetic ParticlesPhysical Review Letters, 1994
- A magnetic force microscopy analysis of soft thin film elementsIEEE Transactions on Magnetics, 1994
- Measuring the coercivity of individual sub-micron ferromagnetic particles by Lorentz microscopyIEEE Transactions on Magnetics, 1991
- Theory of ion-hose instabilityJournal of Applied Physics, 1989
- Holographic interference electron microscopy for determining specimen magnetic structure and thickness distributionPhysical Review B, 1986
- The measurement of the anisotropy field of single "tape" particlesIEEE Transactions on Magnetics, 1984