Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods
- 1 June 2001
- journal article
- research article
- Published by Elsevier BV in Applied Surface Science
- Vol. 177 (1-2), 58-65
- https://doi.org/10.1016/s0169-4332(01)00209-4
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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