On the flicker noise in submicron silicon MOSFETs
- 1 May 1999
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 43 (5), 865-882
- https://doi.org/10.1016/s0038-1101(98)00322-0
Abstract
No abstract availableThis publication has 80 references indexed in Scilit:
- Noise as a diagnostic tool for quality and reliability of electronic devicesIEEE Transactions on Electron Devices, 1994
- Low-frequency noise spectroscopyIEEE Transactions on Electron Devices, 1994
- Impact of Scaling Down on Low Frequency Noise in Silicon MOS Transistorsphysica status solidi (a), 1992
- Correlation between most 1/f noise and CCD transfer inefficiencySolid-State Electronics, 1985
- Correlation between 1/f noise and interface state density at the Fermi level in field-effect transistorsJournal of Applied Physics, 1985
- Experimental studies on 1/f noiseReports on Progress in Physics, 1981
- Theory and experiments on surface 1/f noiseIEEE Transactions on Electron Devices, 1972
- Characterization of low 1/f noise in MOS transistorsIEEE Transactions on Electron Devices, 1971
- 1/ƒ noise is no surface effectPhysics Letters A, 1969
- Low frequency noise in MOS transistors—II ExperimentsSolid-State Electronics, 1968