Nanoindentation and near-field spectroscopy of single semiconductor quantum dots
- 5 April 2004
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 69 (15), 155306
- https://doi.org/10.1103/physrevb.69.155306
Abstract
Low-temperature near-field scanning optical microscopy was used to study the dependence of the emission spectra of single self-organized InAs on GaAs, InAs on AlAs and InP on GaInP quantum dots (QDs) on contact pressure exerted by a near-field optical fiber tip (nanoindentation). A large energy shift (up to 150 meV), broadening (up to 10 meV), and intensity increase (up to one order of magnitude) of single QD emission lines have been observed at tip compressions up to 70 nm. Ground state energy shift rates from 0.5 to 3.5 meV/nm have been measured for different aperture types (rounded and flat, metal coated and uncoated) and sizes (50–300 nm) in agreement with numerical calculations using Picus–Bir orbital-strain Hamiltonian. A reduction of the hydrostatic pressure coefficient due to a nonuniform In distribution in self-organized QDs has been observed. Anomalously strong lateral inhomogeneity of the local stress field has been observed.Keywords
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