Development of a Process Analytical Technology (PAT) for in-line monitoring of film thickness and mass of coating materials during a pan coating operation
- 17 July 2011
- journal article
- Published by Elsevier BV in European Journal of Pharmaceutical Sciences
- Vol. 43 (4), 244-250
- https://doi.org/10.1016/j.ejps.2011.04.017
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- Comparative study of non-destructive methods to quantify thickness of tablet coatingsInternational Journal of Pharmaceutics, 2010
- Comparison of Terahertz Pulse Imaging and Near-Infrared Spectroscopy for Rapid, Non-Destructive Analysis of Tablet Coating Thickness and UniformityJournal of Pharmaceutical Innovation, 2007
- Analysis of sustained-release tablet film coats using terahertz pulsed imagingJournal of Controlled Release, 2007
- Nondestructive Analysis of Tablet Coating Thicknesses Using Terahertz Pulsed ImagingJournal of Pharmaceutical Sciences, 2005
- Quantitative Analysis of Film Coating in a Fluidized Bed Process by In-Line NIR Spectrometry and Multivariate Batch CalibrationAnalytical Chemistry, 2000
- Monitoring of a film coating process for tablets using near infrared reflectance spectrometryJournal of Pharmaceutical and Biomedical Analysis, 1999
- Determination of SB 216469-S during tablet production using near-infrared reflectance spectroscopyJournal of Pharmaceutical and Biomedical Analysis, 1996
- Near-Infrared Spectroscopic Monitoring of the Film Coating ProcessPharmaceutical Research, 1996
- Determination of film-coated tablet parameters by near-infrared spectroscopyJournal of Pharmaceutical and Biomedical Analysis, 1995
- Standard Normal Variate Transformation and De-Trending of Near-Infrared Diffuse Reflectance SpectraApplied Spectroscopy, 1989