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BY
Bo Yang
Bo Yang
KW
Kaijie Wu
Kaijie Wu
RK
Ramesh Karri
Ramesh Karri
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1 January 2005
conference paper
conference paper
Published by
Association for Computing Machinery (ACM)
in
Proceedings of the 42nd annual conference on Design automation - DAC '05
p.
135-140
https://doi.org/10.1145/1065579.1065617
Abstract
No abstract available
Keywords
CRYPTO HARDWARE
SCAN-BASED DFT
SECURITY
TESTABILITY
Cited by 16 articles