The tomographic atom probe: A quantitative three-dimensional nanoanalytical instrument on an atomic scale
- 1 October 1993
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (10), 2911-2919
- https://doi.org/10.1063/1.1144382
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- An atom probe for three-dimensional tomographyNature, 1993
- Performance of an energy compensated time-of-flight mass spectrometerSurface Science, 1992
- Implementation of the optical atom probeSurface Science, 1992
- TOWARD A TOMOGRAPHIC ATOM-PROBELe Journal de Physique Colloques, 1989
- DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBELe Journal de Physique Colloques, 1988
- Direction et distance d'analyse à la sonde atomiqueRevue de Physique Appliquée, 1982
- Performance of the new high mass resolution time of flight atom probeReview of Scientific Instruments, 1981
- Pulsed-laser atom-probe field-ion microscopyJournal of Applied Physics, 1980
- The crystallographic distribution of field-desorbed speciesJournal of Vacuum Science and Technology, 1974
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968