Condenser for Koehler-like illumination in transmission x-ray microscopes at undulator sources
- 15 May 2006
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 31 (10), 1465-1467
- https://doi.org/10.1364/ol.31.001465
Abstract
We report on a novel condenser for full-field transmission x-ray microscopes that use synchrotron radiation from an undulator source. The condenser produces a Koehler-like homogeneous intensity distribution in the sample plane and eliminates object illumination problems connected with the high degree of spatial coherence in an undulator beam. The optic consists of a large number of small linear diffraction gratings and is therefore relatively easy to manufacture. First imaging experiments with a prototype condenser were successfully performed with the Twinmic x-ray microscope at the Elettra synchrotron facility in Italy.Keywords
This publication has 5 references indexed in Scilit:
- Phase and intensity control through diffractive optical elements in X-ray microscopyJournal of Electron Spectroscopy and Related Phenomena, 2005
- TwinMic: Combined scanning and full‐field imaging microscopy with novel contrast mechanismsSynchrotron Radiation News, 2003
- Fourier-synthesis custom-coherence illuminator for extreme ultraviolet microfield lithographyApplied Optics, 2003
- New high‐resolution zone‐plate microscope at beamline 6.1 of the ALSSynchrotron Radiation News, 1995
- The Göttingen X-ray microscopesNuclear Instruments and Methods in Physics Research, 1983