Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures
- 13 October 2008
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 93 (15), 153107
- https://doi.org/10.1063/1.2998656
Abstract
High angle annular dark field scanning transmission electron microscopy (HAADF-STEM) is a powerful tool to quantify size, shape, position, and composition of nano-objects with the assessment of image simulation. Due to the high computational requirements needed, nowadays it can only be applied to a few unit cells in standard computers. To overpass this limitation, a parallel software (SICSTEM) has been developed. This software can afford HAADF-STEM image simulations of nanostructures composed of several hundred thousand atoms in manageable time. The usefulness of this tool is exemplified by simulating a HAADF-STEM image of an InAs nanowire.Keywords
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