In situ high voltage tem observation of an electrohydrodynamic (EHD) ion source
- 31 December 1985
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 16 (1), 1-8
- https://doi.org/10.1016/s0304-3991(85)80002-4
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Derivation of a modified paraxial formalism for two-dimensional trajectories in electron and ion sources of non-simple geometriesApplied Physics A, 1984
- Electronic environment for a field emission gun in electron microscopyRevue de Physique Appliquée, 1983
- Triode and tetrode guns for field emission electron microscopesUltramicroscopy, 1981
- Trajectory calculations of the extraction region of a liquid-metal ion sourceJournal of Vacuum Science and Technology, 1981
- On the mechanism of liquid metal electron and ion sourcesApplied Physics A, 1979
- An AES study of the surface composition of ion-etched iron–chromium alloys: effect of adsorbed COJournal of Vacuum Science and Technology, 1979
- Fine-focus ion beams with field ionizationJournal of Vacuum Science and Technology, 1978
- RESULTS WITH A PROTON SCANNING MICROSCOPE AND COMPARISON OF PROTON DAMAGE WITH ELECTRON DAMAGE*Annals of the New York Academy of Sciences, 1978
- Instability of Electrified Liquid SurfacesPhysical Review B, 1917
- XX. On the equilibrium of liquid conducting masses charged with electricityThe London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 1882