Field‐induced migration of sodium in soda silicate glasses during scanning electron microscopy
- 1 January 1989
- Vol. 11 (1), 5-11
- https://doi.org/10.1002/sca.4950110103
Abstract
No abstract availableFunding Information
- Department of Energy; Office of Basic Energy Sciences (DE-F603-86ER45279)
This publication has 9 references indexed in Scilit:
- Some considerations on the electric field induced in insulators by electron bombardmentJournal of Applied Physics, 1986
- Universal correction procedure for electron-probe microanalysis. II. The absorption correctionJournal of Physics D: Applied Physics, 1985
- Mobility and surface recombination processes of primary electrons in dielectric systems during Auger electron spectroscopyPhysics Letters A, 1984
- Properties of ion implanted glassesNuclear Instruments and Methods in Physics Research, 1983
- Numerical analysis of field-assisted sodium migration in electron-irradiated glassesJournal of Physics C: Solid State Physics, 1982
- Sodium ion migration in glass on electron beam irradiationJournal of Physics C: Solid State Physics, 1981
- Electron beam damage in Auger electron spectroscopyApplications of Surface Science, 1981
- Scanning Electron Microscopy and X-Ray MicroanalysisPublished by Springer Science and Business Media LLC ,1981
- Monte Carlo Simulation in Analytical Electron MicroscopyPublished by Springer Science and Business Media LLC ,1979