Wavelets and their applications for surface metrology
- 1 January 2008
- journal article
- Published by Elsevier BV in CIRP Annals
- Vol. 57 (1), 555-558
- https://doi.org/10.1016/j.cirp.2008.03.110
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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