Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates
Top Cited Papers
- 16 February 2012
- journal article
- research article
- Published by Wiley in Advanced Functional Materials
- Vol. 22 (9), 1894-1905
- https://doi.org/10.1002/adfm.201102913
Abstract
No abstract availableKeywords
This publication has 35 references indexed in Scilit:
- A Novel Wet Chemistry Approach for the Synthesis of Hybrid 2D Free-Floating Single or Multilayer Nanosheets of MS2@oleylamine (M═Mo, W)Chemistry of Materials, 2011
- MoS2 and WS2 Analogues of GrapheneAngewandte Chemie-International Edition, 2010
- Frictional Characteristics of Atomically Thin SheetsScience, 2010
- Electric field effect on superconductivity in atomically thin flakes ofPhysical Review B, 2009
- Graphene: Status and ProspectsScience, 2009
- Making graphene visibleApplied Physics Letters, 2007
- Ultrathin Epitaxial Graphite: 2D Electron Gas Properties and a Route toward Graphene-based NanoelectronicsThe Journal of Physical Chemistry B, 2004
- Raman scattering under pressure and the phase transition in ε‐GaSePhysica Status Solidi (b), 2003
- Raman investigation of InSe and GaSe single-crystals oxidationSemiconductor Science and Technology, 2002
- Kramers-Kronig analysis of the reflectivity spectra of 2H-MoS2, 2H-MoSe2and 2H-MoTe2Journal of Physics C: Solid State Physics, 1979