Electron Injection, Recombination, and Halide Oxidation Dynamics at Dye-Sensitized Metal Oxide Interfaces
- 13 April 2000
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry A
- Vol. 104 (18), 4256-4262
- https://doi.org/10.1021/jp993438y
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- Spectral Characterization of the One-Electron Oxidation Product of cis-Bis(isothiocyanato)bis(4,4‘-dicarboxylato-2,2‘-bipyridyl) Ruthenium(II) Complex Using Pulse RadiolysisThe Journal of Physical Chemistry B, 1998
- Comment on “Measurement of Ultrafast Photoinduced Electron Transfer from Chemically Anchored Ru−Dye Molecules into Empty Electronic States in a Colloidal Anatase TiO2 Film”The Journal of Physical Chemistry B, 1998
- Direct Time-Resolved Infrared Measurement of Electron Injection in Dye-Sensitized Titanium Dioxide FilmsThe Journal of Physical Chemistry B, 1997
- Measurement of Ultrafast Photoinduced Electron Transfer from Chemically Anchored Ru-Dye Molecules into Empty Electronic States in a Colloidal Anatase TiO2 FilmThe Journal of Physical Chemistry B, 1997
- An Acetylacetonate-Based Semiconductor−Sensitizer LinkageInorganic Chemistry, 1996
- Electrical and optical properties of porous nanocrystalline TiO2 filmsThe Journal of Physical Chemistry, 1995
- Dual-beam subpicosecond broadband infrared spectrometerOptics Letters, 1994
- Molecular level photovoltaics: the electrooptical properties of metal cyanide complexes anchored to titanium dioxideThe Journal of Physical Chemistry, 1993
- Conversion of Light into Electricity with Trinuclear Ruthenium Complexes Adsorbed on Textured TiO2 FilmsHelvetica Chimica Acta, 1990
- Heterogeneous electrochemical systems for solar energy conversionPublished by Walter de Gruyter GmbH ,1980