Application of capacitance-voltage measurements to the determination of interface roughness in nanoparticulate field-effect transistors
- 9 June 2010
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 207 (7), 1672-1676
- https://doi.org/10.1002/pssa.200983737
Abstract
No abstract availableKeywords
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