Application of tip-enhanced microscopy for nonlinear Raman spectroscopy
- 8 March 2004
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 84 (10), 1768-1770
- https://doi.org/10.1063/1.1647277
Abstract
A tip-enhanced electric field at a metallic probe tip of apertureless near-field scanning optical microscope was applied to a third-order nonlinear optical process, coherent anti-Stokes Raman spectroscopy. The combination of the enhanced field and third-order nonlinearity resolved molecular vibrations of adenine molecules embedded in deoxyribonucleic acid double-helix nanocrystals beyond the diffraction limit of light.Keywords
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