Detecting failure of antenna array elements using machine learning optimization
- 1 June 2007
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 5753-5756
- https://doi.org/10.1109/aps.2007.4396858
Abstract
A Multi-class support vector classifier (SVC) is proposed for planar array failure diagnosis. Extracted feature information from the far field intensity of the array is used to train and test the multi-class SVC, so one can detect the location of failed elements in an array and also the level of failure.Keywords
This publication has 3 references indexed in Scilit:
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