A new formalism that combines advantages of fault-trees and Markov models: Boolean logic driven Markov processes
- 1 November 2003
- journal article
- Published by Elsevier BV in Reliability Engineering & System Safety
- Vol. 82 (2), 149-163
- https://doi.org/10.1016/s0951-8320(03)00143-1
Abstract
No abstract availableKeywords
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