Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy
- 1 June 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (6S)
- https://doi.org/10.1143/jjap.33.3785
Abstract
The development of the scanning tunneling microscopy has led to the development of related techniques which include the scanning near-field microscopy (SNOM) and the scanning thermal microscopy (SThM). These techniques provide sample information in addition to the simultaneously obtained topography. With SNOM normal optical microscopy contrast mechanisms (adsorbance, fluorescence, polarization, etc.) can be used. The principles and design of a SNOM are presented. Subwavelength resolution (better than λ/20) is demonstrated. In SThM, the contrast is provided by temperature and thermal conductivity. The design of a resistive thermal probe is described. Several operating modes are described and image contrast due to thermal conductivity is demonstrated.Keywords
This publication has 13 references indexed in Scilit:
- Thermal imaging using the atomic force microscopeApplied Physics Letters, 1993
- Scanning probe microscopy of thermal conductivity and subsurface propertiesApplied Physics Letters, 1992
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- Analytical photon scanning tunneling microscopyPhysical Review B, 1990
- The Children of the STMScience, 1990
- Optical absorption microscopy and spectroscopy with nanometre resolutionNature, 1989
- Scanning thermal profilerApplied Physics Letters, 1986
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982
- Super-resolution Aperture Scanning MicroscopeNature, 1972