Photocurent spectroscopy in thin-film insulators: Voltage dependence of the external-circuit current
- 15 February 1974
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 9 (4), 1874-1883
- https://doi.org/10.1103/physrevb.9.1874
Abstract
An analytical model for trapping-state photodepopulation measurements in conductor-thin-film-insulator-conductor structures is presented. The external-circuit-current dependence on applied voltage is determined, and it is shown that moments of the spatial distribution of trapped charge in the insulator can be extracted from collected-charge versus applied-field characteristic curves. The photodepopulation technique is compared with more widely used differential-capacitance and phtoemission-current techniques.Keywords
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