Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients
- 1 April 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 49 (2), 285-289
- https://doi.org/10.1109/19.843065
Abstract
This paper describes a new approach for fast andaccurate determination of the source reflection coefficient inmicrowave source-pull measurements. To the authors" knowledge,this is the only technique that allows the simultaneous measurementof the source and the device-under-test input reflectioncoefficients. A traditional vector network analyzer is used as afour-channel receiver. The calibration procedure is based on anew reflectometer model that extends the traditional error boxconcept. ...Keywords
This publication has 11 references indexed in Scilit:
- Accurate on-wafer power and harmonic measurements of MM-wave amplifiers and devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Multitone characterization and design of FET resistive mixers based on combined active source-pull/load-pull techniquesIEEE Transactions on Microwave Theory and Techniques, 1998
- Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniquesIEEE Transactions on Microwave Theory and Techniques, 1998
- Noise measurements of microwave transistors using an uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometerIEEE Transactions on Instrumentation and Measurement, 1995
- Source-pull/load-pull oscillator measurements at microwave/MM wave frequenciesIEEE Transactions on Instrumentation and Measurement, 1992
- A generalized theory and new calibration procedures for network analyzer self-calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- Improvements to On-Wafer Noise Parameter MeasurementsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1990
- Improved Error-Correction Technique for Large-Signal Load-Pull Measurements (Short Paper)IEEE Transactions on Microwave Theory and Techniques, 1987
- ‘Source-pull’ technique at microwave frequenciesElectronics Letters, 1984
- A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage ErrorsIEEE Transactions on Microwave Theory and Techniques, 1977