Evaluation of Residual Strain and Oxygen Vacancy in Multilayer Ceramic Capacitor Using Laser Raman Spectroscopy
- 1 October 2007
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 46 (10S)
- https://doi.org/10.1143/jjap.46.7005
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC DevicesKey Engineering Materials, 2006
- Thermally Stimulated Current Measurement for Degraded Pb(Ti,Zr)O3Thin-Film CapacitorsJapanese Journal of Applied Physics, 2003
- Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future PerspectivesJapanese Journal of Applied Physics, 2003
- Effect of Mn Addition on dc-Electrical Degradation of Multilayer Ceramic Capacitor with Ni Internal ElectrodeJapanese Journal of Applied Physics, 2002
- Effects of Rare-Earth Oxides on the Reliability of X7R DielectricsJapanese Journal of Applied Physics, 2002
- dc-Electrical Degradation of the BT-Based Material for Multilayer Ceramic Capacitor with Ni internal Electrode: Impedance Analysis and MicrostructureJapanese Journal of Applied Physics, 2001
- Multilayer ceramic capacitorsCurrent Opinion in Solid State and Materials Science, 1997
- Comment on “Characterization of Interfacial Properties in Fiber‐Reinforced Cementitious Composites”Journal of the American Ceramic Society, 1993
- Piezoelectrically-induced switching of 90° domains in tetragonal BaTiO3 and PbTiO3 investigated by micro-Raman spectroscopyJournal of Applied Physics, 1992
- Lattice dynamics of crystals with tetragonalstructurePhysical Review B, 1988