Direct measurement of crystallographic phase by electron diffraction
- 14 September 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 59 (11), 1216-1219
- https://doi.org/10.1103/physrevlett.59.1216
Abstract
Three-beam diffraction is analyzed in a geometry appropriate for high-energy electron diffraction. An expression for the lowest-order correction to the kinematic intensity is derived from which a prescription for measuring crystallographic-phase invariant is obtained. This analysis is a good approximation for the diffraction observed in large convergence angle electron-diffraction patterns. Phase invariants are measured in the noncentrosymmetric crystal InP to an accuracy of ±15°. The technique provides a general and practical method for measuring phases.Keywords
This publication has 7 references indexed in Scilit:
- Measurement of kinematic intensities from large-angle electron diffraction patternsPhilosophical Magazine A, 1986
- Invariant-Phase Information of X-Ray Structure Factors in the Two-Beam Bragg Intensity near a Three-Beam PointPhysical Review Letters, 1982
- The scattering of fast electrons by crystalsReports on Progress in Physics, 1979
- Diffraction contrast of electron microscope images of crystal lattice defects - II. The development of a dynamical theoryProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1961
- Direct Determination of X-Ray Reflection Phase Relationships Through Simultaneous ReflectionPhysical Review Letters, 1961
- Study of Simultaneous Reflexion in Electron Diffraction by Crystals I. Theoretical TreatmentJournal of the Physics Society Japan, 1957
- Relative phases of diffraction maxima by multiple reflectionActa Crystallographica, 1949