Hole injection SiO/sub 2/ breakdown model for very low voltage lifetime extrapolation
- 1 May 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (5), 761-767
- https://doi.org/10.1109/16.285029
Abstract
No abstract availableThis publication has 41 references indexed in Scilit:
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