Infrared ellipsometry—measurement of the optical properties of thin silver and gold films at 1.15, 3.39 and 10 μm
- 30 September 1975
- journal article
- Published by Elsevier BV in Optics Communications
- Vol. 15 (1), 115-120
- https://doi.org/10.1016/0030-4018(75)90197-2
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
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- Measurement of Epitaxial Film Thickness Using an Infrared EllipsometerJournal of the Electrochemical Society, 1966
- XXVI. Optical constants of metals in the infra-red—experimental methodsThe London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 1955
- XXV. Optical constants of metals in the, infra-red—Principles of measurementThe London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 1955
- On the Analysis of Elliptically Polarized Radiation in the Infrared RegionJournal of the Optical Society of America, 1954