Misfit dislocations at the GaN/SiC interface and their interaction with point defects
- 1 November 2000
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 44 (11), 1955-1960
- https://doi.org/10.1016/s0038-1101(00)00169-6
Abstract
No abstract availableKeywords
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