Evaluation of structural degradation in packaged semiconductor components using a transient thermal characterisation technique
- 29 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A transient thermal characterisation technique for monitoring structural degradation in microelectronic components will be presented. This non destructive package quality evaluation technique is based on indirect transient temperature response measurements and can be used to determine both the existence and location of structural defects in packaged semiconductor devices. The effect of package thermal properties on the transient temperature response is first investigated by means of finite element analysis. Practical thermal impedance measurements on a hybrid test structure and a 48-lead TSSOP illustrate the capabilities of the transient measurement technique with respect to failure characterisation in microelectronic packages.Keywords
This publication has 2 references indexed in Scilit:
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