Imaging Electromigration during the Formation of Break Junctions
- 17 February 2007
- journal article
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 7 (3), 652-656
- https://doi.org/10.1021/nl062631i
Abstract
Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.Keywords
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