Possible use of low voltage accelerators in PIXE analysis
- 1 September 1996
- journal article
- Published by Springer Science and Business Media LLC in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 209 (1), 201-210
- https://doi.org/10.1007/bf02063544
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Specific applications of a 350 kv ion accelerator for PIXE analysis of solid state samplesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Multielementanalyse galvanischer Schichten mit der niederenergetischen PIXEIsotopenpraxis Isotopes in Environmental and Health Studies, 1984
- Sensitivity in light element analysis by 2 MeV and 150 keV proton and photon induced X-raysNuclear Instruments and Methods, 1978
- Voltage calibration of low-energy acceleratorsThe European Physical Journal A, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Energy levels of light nuclei A = 11–12Nuclear Physics A, 1975
- Proton Induced X Ray Fluorescence Analysis Using a Cockcroft-Walton AcceleratorPublished by Springer Science and Business Media LLC ,1975
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- Oxide-thickness determination by proton-induced x-ray fluorescenceJournal of Applied Physics, 1972
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970