Dislocation Scattering in Teflon at Low Temperatures
- 4 September 1972
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 29 (10), 642-643
- https://doi.org/10.1103/physrevlett.29.642
Abstract
The thermal conductivity of a sample of Teflon was measured in the temperature range 0.17 to 4.0°K. A good fit to these data was obtained by using dislocation scattering of phonons and a Debye frequency distribution.
Keywords
This publication has 5 references indexed in Scilit:
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