Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting
- 1 March 2012
- journal article
- Published by Elsevier BV in Acta Materialia
- Vol. 60 (5), 2337-2349
- https://doi.org/10.1016/j.actamat.2011.12.035
Abstract
No abstract availableKeywords
This publication has 63 references indexed in Scilit:
- Mapping Residual Stress Distributions at the Micron Scale in Amorphous MaterialsMetallurgical and Materials Transactions A, 2009
- Plastic deformation of a Co-based metallic glass composite with in situ precipitated dendritic phasesScripta Materialia, 2008
- An approach to modeling the S–N behavior of bulk-metallic glassesActa Materialia, 2008
- Mechanical behavior of amorphous alloysActa Materialia, 2007
- Making metallic glasses plastic by control of residual stressNature Materials, 2006
- Stress-life fatigue behavior of a Zr-based bulk metallic glassActa Materialia, 2006
- Fatigue behavior of bulk-metallic glassesIntermetallics, 2004
- Strain rate effect on metallic glass ductilityScripta Materialia, 2004
- Enhanced Shot Peening Effect for Steels by Using Fe-based Glassy Alloy ShotsMATERIALS TRANSACTIONS, 2003
- Bulk Glass-Forming Metallic Alloys: Science and TechnologyMRS Bulletin, 1999