On the theoretical basis of metric analysis of poorly formalized problems of recognition and classification
- 1 October 2015
- journal article
- Published by Pleiades Publishing Ltd in Pattern Recognition and Image Analysis
- Vol. 25 (4), 577-587
- https://doi.org/10.1134/s1054661815040252
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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