Quantitative Thermometry of Nanoscale Hot Spots
- 3 January 2012
- journal article
- letter
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 12 (2), 596-601
- https://doi.org/10.1021/nl203169t
Abstract
A method is described to quantify thermal conductance and temperature distributions with nanoscale resolution using scanning thermal microscopy. In the first step, the thermal resistance of the tip–surface contact is measured for each point of a surface. In the second step, the local temperature is determined from the difference between the measured heat flux for heat sources switched on and off. The method is demonstrated using self-heating of silicon nanowires. While a homogeneous nanowire shows a bell-shaped temperature profile, a nanowire diode exhibits a hot spot centered near the junction between two doped segments.Keywords
This publication has 26 references indexed in Scilit:
- Quantitative Heat Dissipation Characteristics in Current-Carrying GaN Nanowires Probed by Combining Scanning Thermal Microscopy and Spatially Resolved Raman SpectroscopyACS Nano, 2010
- Nanoscale Thermometry Using Point Contact ThermocouplesNano Letters, 2010
- The experimental investigation of thermal conductivity and the Wiedemann–Franz law for single metallic nanowiresNanotechnology, 2009
- Microscale and Nanoscale Thermal Characterization TechniquesJournal of Electronic Packaging, 2008
- Predicting the Thermal Resistance of Nanosized ConstrictionsNano Letters, 2005
- Nanoscale heat transfer at contact between a hot tip and a substrateInternational Journal of Heat and Mass Transfer, 2005
- Nanoscale thermal transportJournal of Applied Physics, 2003
- Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and StructuresJournal of Heat Transfer, 2001
- SCANNING THERMAL MICROSCOPYAnnual Review of Materials Science, 1999
- Sub-surface imaging by scanning thermal microscopyMeasurement Science and Technology, 1996