Characterization of a diffusion-bonded Al-Mg alloy/SiC interface by high resolution and analytical electron microscopy
- 1 March 1994
- journal article
- Published by Springer Science and Business Media LLC in Metallurgical and Materials Transactions A
- Vol. 25 (3), 617-627
- https://doi.org/10.1007/bf02651603
Abstract
No abstract availableKeywords
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