Automatic thresholding for defect detection
Top Cited Papers
- 15 October 2006
- journal article
- research article
- Published by Elsevier BV in Pattern Recognition Letters
- Vol. 27 (14), 1644-1649
- https://doi.org/10.1016/j.patrec.2006.03.009
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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