Statistical monitoring and control of a low defect process
- 1 November 1991
- journal article
- research article
- Published by Wiley in Quality and Reliability Engineering International
- Vol. 7 (6), 479-483
- https://doi.org/10.1002/qre.4680070607
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Counted Data CUSUM'sTechnometrics, 1985
- Quality Control Techniques for "Zero Defects"IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1983