Field-enhanced scanning optical microscope
- 1 May 2000
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 25 (9), 631-633
- https://doi.org/10.1364/ol.25.000631
Abstract
We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a -polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip–sample distance, yielding the ultrahigh vertical resolution reached in the images.
Keywords
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