Modeling, measurement, and simulation of simultaneous switching noise
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
- Vol. 19 (3), 461-472
- https://doi.org/10.1109/96.533884
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Decoupling capacitor calculations for CMOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Interconnect design with VLSI CMOSIBM Journal of Research and Development, 1995
- Simultaneous Switching Noise of CMOS Devices and SystemsPublished by Springer Science and Business Media LLC ,1994
- Decoupling capacitor effects on switching noiseIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1993
- Package Electrical DesignPublished by Springer Science and Business Media LLC ,1989
- Delta-I noise specification for a high-performance computing machineProceedings of the IEEE, 1985
- Three-Dimensional Inductance Computations with Partial Element Equivalent CircuitsIBM Journal of Research and Development, 1979