Temperature dependence of transport and trapping properties of oxide-nitride-oxide dielectric films
- 31 July 1997
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 41 (7), 1041-1049
- https://doi.org/10.1016/s0038-1101(97)00018-x
Abstract
No abstract availableKeywords
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