High resolution imaging by organic secondary ion mass spectrometry
- 30 November 2007
- journal article
- review article
- Published by Elsevier BV in Trends in Biotechnology
- Vol. 25 (11), 499-504
- https://doi.org/10.1016/j.tibtech.2007.07.010
Abstract
No abstract availableKeywords
This publication has 37 references indexed in Scilit:
- Localization of lipids in the aortic wall with imaging TOF-SIMSBiochimica et Biophysica Acta (BBA) - Molecular and Cell Biology of Lipids, 2007
- Analysis of bone minerals by time‐of‐flight secondary ion mass spectrometry: a comparative study using monoatomic and cluster ions sourcesRapid Communications in Mass Spectrometry, 2007
- Topography in secondary ion mass spectroscopy imagesJournal of Vacuum Science & Technology A, 2006
- Distribution of cholesterol and galactosylceramide in rat cerebellar white matterBiochimica et Biophysica Acta (BBA) - Molecular and Cell Biology of Lipids, 2006
- Localization of cholesterol, phosphocholine and galactosylceramide in rat cerebellar cortex with imaging TOF-SIMS equipped with a bismuth cluster ion sourceBiochimica et Biophysica Acta (BBA) - Molecular and Cell Biology of Lipids, 2005
- Bioimaging TOF-SIMS: localization of cholesterol in rat kidney sectionsFEBS Letters, 2004
- Time-of-flight secondary ion mass spectrometry (TOF-SIMS):—versatility in chemical and imaging surface analysisThe Analyst, 2004
- SIMS: from research to production controlSurface and Interface Analysis, 2003
- Peer Reviewed: Organic SIMS of Biologic TissueAnalytical Chemistry, 1997
- Secondary-ion yields from surfaces bombarded with keV molecular and cluster ionsPhysical Review Letters, 1989