The Scanning Ion-Conductance Microscope
- 3 February 1989
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 243 (4891), 641-643
- https://doi.org/10.1126/science.2464851
Abstract
A scanning ion-conductance microscope (SICM) has been developed that can image the topography of nonconducting surfaces that are covered with electrolytes. The probe of the SICM is an electrolyte-filled micropipette. The flow of ions through the opening of the pipette is blocked at short distances between the probe and the surface, thus, limiting the ion conductance. A feedback mechanism can be used to maintain a given conductance and in turn determine the distance to the surface. The SICM can also sample and image the local ion currents above the surfaces. To illustrate its potential for imaging ion currents through channels in membranes, a topographic image of a membrane filter with 0.80-micrometer pores and an image of the ion currents flowing through such pores are presented.Keywords
This publication has 18 references indexed in Scilit:
- Scanning electrochemical microscopy. Introduction and principlesAnalytical Chemistry, 1989
- Bubble pressure measurement of micropipet tip outer diameterJournal of Neuroscience Methods, 1987
- Scanning tunneling microscopy of processes at liquid-solid interfacesSurface Science, 1987
- Scanning tunneling microscopy study of metals: Spectroscopy and topographySurface Science, 1987
- Atomic-scale surface modifications using a tunnelling microscopeNature, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986
- Extracellular current measurements with a vibrating probeTrends in Neurosciences, 1985
- Development of a 500 Å spatial resolution light microscope: I. light is efficiently transmitted through λ/16 diameter aperturesUltramicroscopy, 1984
- Surface Studies by Scanning Tunneling MicroscopyPhysical Review Letters, 1982
- A Scanning Micropipette Molecule MicroscopeScience, 1981