Surface photovoltage phase spectroscopy – a handy tool for characterisation of bulk semiconductors and nanostructures
- 15 April 2006
- journal article
- Published by Elsevier BV in Materials Science and Engineering B
- Vol. 129 (1-3), 186-192
- https://doi.org/10.1016/j.mseb.2006.01.010
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structuresJournal of Physics: Condensed Matter, 2002
- Surface photovoltage studies of and quantum well structuresPhysical Review B, 2002
- Frequency and intensity dependence of the sub-band-gap features observed in the surface photovoltage spectrum of semi-insulating GaAsJournal of Applied Physics, 2002
- Photovoltage spectroscopy of InAs/GaAs quantum dot structuresJournal of Applied Physics, 2002
- Absorption edge determination of thick GaAs wafers using surface photovoltage spectroscopyReview of Scientific Instruments, 2002
- Silicon Epitaxial Layer Lifetime CharacterizationJournal of the Electrochemical Society, 2001
- Bound exciton effect and carrier escape mechanisms in temperature-dependent surface photovoltage spectroscopy of a single quantum wellPhysical Review B, 2000
- Hydrogen passivation of AlxGa1−xAs/GaAs studied by surface photovoltage spectroscopyPhysica B: Condensed Matter, 1999
- Frequency dependence of photo-EMF of strongly inverted Ge and Si MIS structures—II experimentsSolid-State Electronics, 1975
- Frequency dependence of the photo-EMF of strongly inverted Ge and Si MIS structures—I. TheorySolid-State Electronics, 1975