FPGA-accelerated textured surface defect segmentation based on complete period Fourier reconstruction
- 27 November 2019
- journal article
- research article
- Published by Springer Science and Business Media LLC in Journal of Real-Time Image Processing
- Vol. 17 (5), 1659-1673
- https://doi.org/10.1007/s11554-019-00927-1
Abstract
No abstract availableKeywords
Funding Information
- National Key Scientific Instrument and Equipment Development Projects of China (2013YQ220749)
- National Key Research and Development Program of China (2018YFB2003801)
- National Natural Science Foundation of China (51875164)
This publication has 18 references indexed in Scilit:
- Detection of surface cutting defect on magnet using Fourier image reconstructionJournal of Central South University, 2016
- A cost-effective and automatic surface defect inspection system for hot-rolled flat steelRobotics and Computer-Integrated Manufacturing, 2016
- Defect detection of polycrystalline solar wafers using local binary meanThe International Journal of Advanced Manufacturing Technology, 2015
- Defect inspection for TFT-LCD images based on the low-rank matrix reconstructionNeurocomputing, 2015
- Defect detection of solar cells in electroluminescence images using Fourier image reconstructionSolar Energy Materials and Solar Cells, 2012
- Directional textures auto-inspection using discrete cosine transformInternational Journal of Production Research, 2011
- Fabric defect detection using morphological filtersImage and Vision Computing, 2009
- One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstructionInternational Journal of Production Research, 2007
- Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decompositionInternational Journal of Production Research, 2005
- Automated inspection of textured ceramic tilesComputers in Industry, 2000