Dynamic characteristics and device degradation of GaN-based vertical-cavity surface-emitting laser with an AlInN/GaN distributed Bragg reflector

Abstract

The dynamic characteristics of GaN-based vertical-cavity surface-emitting laser (VCSEL) with an AlInN/GaN semiconductor distributed Bragg reflector has been reported for the first time. The max dynamic lasing frequency of 1.1 GHz with a wavelength of 415 nm and a threshold current of 7 mA has been demonstrated. Moreover, at the pulse lasing operation, both the steep lasing waveforms and the tailing spontaneous emission waveforms were observed in driven with the square pulse waveforms. The dynamic lasing frequency driven by the sine waveform seems to be related to this steep lasing waveform at the square pulse operation. During these dynamic measurements, the lasing characteristics of the VCSEL were gradually degraded, and the lasing power is decreased by −7 dB at the same bias condition after several hours.